发明名称 |
TENSILE POLYCRYSTALLINE SILICON FILM HAVING STABLE RESISTIVITY AND METHOD OF FABRICATING THEREOF |
摘要 |
Tensile polycrystalline silicon films having improved resistivity and less variability or more stable resistivity in finished semiconductors are provided. The methods of manufacturing such polycrystalline silicon films include application of protective film or film layer prior to annealing the semiconductor. Such devices and methods lead to improved stress control and resistivity. |
申请公布号 |
US2014225115(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201313764349 |
申请日期 |
2013.02.11 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
Tai Kuang-Hui;Lin Hung-Yu;Hsieh Meng Shien;Chiu Teng-Chen;Su Keng Hui |
分类号 |
H01L29/04 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor comprising:
forming a dielectric layer on a substrate; depositing a polysilicon layer on the dielectric layer at a deposition temperature; applying a film to the semiconductor; and annealing the semiconductor. |
地址 |
Hsin-chu TW |