发明名称 METAL-INSULATOR-METAL CAPACITOR OVER CONDUCTIVE LAYER
摘要 A method of fabricating a metal-insulator-metal (MIM) capacitor reduces the number of masks and processing steps compared to conventional techniques. A conductive redistribution layer (RDL) is patterned on a semiconductor chip. A MIM dielectric layer is deposited over the RDL. A first conductive layer of a MIM capacitor is deposited over the MIM dielectric layer. The MIM dielectric layer is patterned using a MIM conductive layer mask. The conductive redistribution layer includes two RDL nodes that extend under the first conductive layer of the MIM capacitor. A conductive via or bump extends through the MIM dielectric layer and couples one of the RDL nodes to the first conductive layer of the MIM capacitor.
申请公布号 US2014225223(A1) 申请公布日期 2014.08.14
申请号 US201313764811 申请日期 2013.02.12
申请人 QUALCOMM INCORPORATED 发明人 Zhu John J.;Chidambaram PR;Nallapati Giridhar;Yeap Choh fei
分类号 H01L49/02 主分类号 H01L49/02
代理机构 代理人
主权项 1. A method of constructing a metal-insulator-metal (MIM) capacitor, comprising: patterning a redistribution layer (RDL) on a semiconductor chip into a first RDL node and a second RDL node; depositing a MIM dielectric layer on the RDL, the MIM dielectric layer extending over the first RDL node and the second RDL node; depositing a first MIM capacitor conductive layer on the MIM dielectric layer, the first MIM capacitor conductive layer extending over the first RDL node and the second RDL node; and patterning the first MIM capacitor conducive layer using a single MIM capacitor mask.
地址 San Diego CA US