发明名称 |
METAL-INSULATOR-METAL CAPACITOR OVER CONDUCTIVE LAYER |
摘要 |
A method of fabricating a metal-insulator-metal (MIM) capacitor reduces the number of masks and processing steps compared to conventional techniques. A conductive redistribution layer (RDL) is patterned on a semiconductor chip. A MIM dielectric layer is deposited over the RDL. A first conductive layer of a MIM capacitor is deposited over the MIM dielectric layer. The MIM dielectric layer is patterned using a MIM conductive layer mask. The conductive redistribution layer includes two RDL nodes that extend under the first conductive layer of the MIM capacitor. A conductive via or bump extends through the MIM dielectric layer and couples one of the RDL nodes to the first conductive layer of the MIM capacitor. |
申请公布号 |
US2014225223(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201313764811 |
申请日期 |
2013.02.12 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
Zhu John J.;Chidambaram PR;Nallapati Giridhar;Yeap Choh fei |
分类号 |
H01L49/02 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of constructing a metal-insulator-metal (MIM) capacitor, comprising:
patterning a redistribution layer (RDL) on a semiconductor chip into a first RDL node and a second RDL node; depositing a MIM dielectric layer on the RDL, the MIM dielectric layer extending over the first RDL node and the second RDL node; depositing a first MIM capacitor conductive layer on the MIM dielectric layer, the first MIM capacitor conductive layer extending over the first RDL node and the second RDL node; and patterning the first MIM capacitor conducive layer using a single MIM capacitor mask. |
地址 |
San Diego CA US |