发明名称 |
DEVICE, X-RAY IRRADIATION METHOD, AND MANUFACTURING METHOD FOR STRUCTURE |
摘要 |
A device capable of suppressing reduction in detection precision is provided. There is provided an apparatus configured to irradiate an object with an X-ray and detect a transmission X-ray transmitted through the object, including: a chamber member defining a first space; and a first supply port arranged in the first space to supply a temperature-controlled gas to a part of an X-ray source configured to irradiate the object with the X-ray. |
申请公布号 |
EP2765407(A1) |
申请公布日期 |
2014.08.13 |
申请号 |
EP20120837797 |
申请日期 |
2012.10.03 |
申请人 |
NIKON CORPORATION |
发明人 |
WATANABE, TAKASHI |
分类号 |
H05G1/02;G01N23/04;H01J35/14 |
主分类号 |
H05G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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