发明名称 Ion implantation at high temperature surface equilibrium conditions
摘要 There are disclosed herein various implementations of a method and system for ion implantation at high temperature surface equilibrium conditions. The method may include situating a III-Nitride semiconductor body in a surface equilibrium chamber, establishing a gas pressure greater than or approximately equal to a surface equilibrium pressure of the III-Nitride semiconductor body, and heating the III-Nitride semiconductor body to an elevated implantation temperature in the surface equilibrium chamber while substantially maintaining the gas pressure. The method also includes implanting the III-Nitride semiconductor body in the surface equilibrium at the elevated implantation temperature chamber while substantially maintaining the gas pressure, the implanting being performed using an ion implanter interfacing with the surface equilibrium chamber.
申请公布号 EP2765596(A1) 申请公布日期 2014.08.13
申请号 EP20140153892 申请日期 2014.02.04
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 BRIERE, MICHAEL A.
分类号 H01L21/265;H01J37/317;H01L21/67 主分类号 H01L21/265
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