Power switching for electronic device test equipment

摘要

An apparatus, system and method are provided for testing a battery-powered electronic device-under-test in a transport frame engaged with a test fixture. A transport frame power supply is arranged to provide power to the DUT in a pre-testing stage. A switching circuit is arranged to switch from the transport frame power supply to a test fixture power supply in response to receiving a power switching signal indicating satisfaction of a pre-testing condition. Power from the test fixture power supply can then be switched back to the first transport frame, or to a second transport frame, to begin testing a second DUT. The ability to start a DUT test without having to wait for the DUT to boot-up in the test fixture reduces test time and increases efficiency of use of test equipment.

主权项

1. A transport frame for testing a battery-powered electronic device-under-test (DUT) in a test fixture, the test fixture arranged to receive the transport frame and to test the DUT when the transport frame is engaged with the test fixture, the test fixture comprising a test fixture power supply arranged to provide power to the DUT in a testing stage, the transport frame comprising:
a transport frame power supply arranged to provide power to the DUT in a pre-testing stage, the transport frame power supply being separately capable of powering the DUT from the text fixture power supply that is separately capable of powering the DUT from the transport frame power supply; and a switching circuit arranged to switch from the transport frame power supply to the test fixture power supply in response to receiving a first power switching signal indicating satisfaction of a pre-testing condition, and arranged to switch from the test fixture power supply to the transport frame power supply in response to receiving a second power switching signal indicating completion of a testing stage.