发明名称 |
Dummy gate electrode of semiconductor device |
摘要 |
The disclosure relates to a dummy gate electrode of a semiconductor device. An embodiment comprises a substrate comprising a first surface; an insulation region covering a portion of the first surface, wherein the top of the insulation region defines a second surface; and a dummy gate electrode over the second surface, wherein the dummy gate electrode comprises a bottom and a base broader than the bottom, wherein a ratio of a width of the bottom to a width of the base is from about 0.5 to about 0.9. |
申请公布号 |
US8803241(B2) |
申请公布日期 |
2014.08.12 |
申请号 |
US201213538734 |
申请日期 |
2012.06.29 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lin Jr-Jung;Lin Chih-Han;Chang Ming-Ching |
分类号 |
H01L21/70 |
主分类号 |
H01L21/70 |
代理机构 |
Slater and Matsil, L.L.P. |
代理人 |
Slater and Matsil, L.L.P. |
主权项 |
1. A semiconductor device comprising:
a substrate comprising a first surface; an insulation region covering a portion of the first surface; a gate electrode over the substrate, the gate electrode having a first base and a first bottom interposed between the first base and the substrate; a dummy gate electrode over the insulation region, the dummy gate electrode electrically isolated from other circuitry on the substrate, wherein the dummy gate electrode comprises a second bottom and a second base broader than the second bottom, wherein the second bottom is wider than the first bottom; and a dummy gate dielectric interposed between the dummy gate electrode and the insulation region. |
地址 |
Hsin-Chu TW |