发明名称 Dummy gate electrode of semiconductor device
摘要 The disclosure relates to a dummy gate electrode of a semiconductor device. An embodiment comprises a substrate comprising a first surface; an insulation region covering a portion of the first surface, wherein the top of the insulation region defines a second surface; and a dummy gate electrode over the second surface, wherein the dummy gate electrode comprises a bottom and a base broader than the bottom, wherein a ratio of a width of the bottom to a width of the base is from about 0.5 to about 0.9.
申请公布号 US8803241(B2) 申请公布日期 2014.08.12
申请号 US201213538734 申请日期 2012.06.29
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lin Jr-Jung;Lin Chih-Han;Chang Ming-Ching
分类号 H01L21/70 主分类号 H01L21/70
代理机构 Slater and Matsil, L.L.P. 代理人 Slater and Matsil, L.L.P.
主权项 1. A semiconductor device comprising: a substrate comprising a first surface; an insulation region covering a portion of the first surface; a gate electrode over the substrate, the gate electrode having a first base and a first bottom interposed between the first base and the substrate; a dummy gate electrode over the insulation region, the dummy gate electrode electrically isolated from other circuitry on the substrate, wherein the dummy gate electrode comprises a second bottom and a second base broader than the second bottom, wherein the second bottom is wider than the first bottom; and a dummy gate dielectric interposed between the dummy gate electrode and the insulation region.
地址 Hsin-Chu TW