发明名称 MOS transistor suppressing short channel effect and method of fabricating the same
摘要 A MOS transistor suppressing a short channel effect includes a substrate, a first diffusion region and a second diffusion region separated from each other by a channel region in an upper portion of the substrate, a gate insulating layer including a first gate insulating layer disposed on a surface of the substrate in the channel region and a second gate insulating layer having a specified depth from the surface of the substrate to be disposed between the first diffusion region and the channel region, and a gate electrode disposed on the first gate insulating layer.
申请公布号 US8803224(B2) 申请公布日期 2014.08.12
申请号 US201213551385 申请日期 2012.07.17
申请人 SK hynix Inc. 发明人 Rouh Kyoung Bong
分类号 H01L29/66;H01L29/08 主分类号 H01L29/66
代理机构 Kilpatrick Townsend & Stockton LLP 代理人 Kilpatrick Townsend & Stockton LLP
主权项 1. A semiconductor device comprising: a substrate; a first diffusion region and a second diffusion region separated from each other by a channel region in an upper portion of the substrate; a gate insulating layer including: a lateral portion disposed on the channel region of the substrate,a first vertical extension joined to a first edge of the lateral portion, anda second vertical extension joined to a second edge of the lateral portion, the second edge being opposite the first edge,wherein the second vertical extention is longer than the first vertical extension, such that the gate insulating layer is asymmetric; and a gate electrode disposed over the first gate insulating layer.
地址 Icheon-si KR