发明名称 Vertical mirror in a silicon photonic circuit
摘要 A vertical total internal reflection (TIR) mirror and fabrication thereof is made by creating a re-entrant profile using crystallographic silicon etching. Starting with an SOI wafer, a deep silicon etch is used to expose the buried oxide layer, which is then wet-etched (in HF), opening the bottom surface of the Si device layer. This bottom silicon surface is then exposed so that in a crystallographic etch, the resulting shape is a re-entrant trapezoid with facets These facets can be used in conjunction with planar silicon waveguides to reflect the light upwards based on the TIR principle. Alternately, light can be coupled into the silicon waveguides from above the wafer for such purposes as wafer level testing.
申请公布号 US8803268(B2) 申请公布日期 2014.08.12
申请号 US201313871083 申请日期 2013.04.26
申请人 Intel Corporation 发明人 Heck John;Liu Ansheng;Morse Michael T.;Rong Haisheng
分类号 H01L27/14 主分类号 H01L27/14
代理机构 Blakely, Sokoloff, Taylor & Zafman LLP 代理人 Blakely, Sokoloff, Taylor & Zafman LLP
主权项 1. A vertical mirror on a silicon photonic circuit, comprising: a silicon device wafer; a buried oxide (BOX) layer under the silicon device wafer; a handle wafer doped with a p-type dopant under the BOX layer; and a trapezoid shaped area having a bottom side defined by the handle wafer, opposite vertical sides defined by the BOX layer, and inwardly angled facets above the vertical sides defined by the silicon device wafer, wherein the facets act as vertical total internal reflection (TIR) mirrors.
地址 Santa Clara CA US
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