发明名称 Nanowire transistor with surrounding gate
摘要 One aspect of the present subject matter relates to a method for forming a transistor. According to an embodiment of the method, a pillar of amorphous semiconductor material is formed on a crystalline substrate, and a solid phase epitaxy process is performed to crystallize the amorphous semiconductor material using the crystalline substrate to seed the crystalline growth. The pillar has a sublithographic thickness. A transistor body is formed in the crystallized semiconductor pillar between a first source/drain region and a second source/drain region. A surrounding gate insulator is formed around the semiconductor pillar, and a surrounding gate is formed around and separated from the semiconductor pillar by the surrounding gate insulator. Other aspects are provided herein.
申请公布号 US8803229(B2) 申请公布日期 2014.08.12
申请号 US201213417809 申请日期 2012.03.12
申请人 Micron Technology, Inc 发明人 Forbes Leonard
分类号 H01L29/78;B82Y10/00;H01L29/66 主分类号 H01L29/78
代理机构 Schwegman, Lundberg & Woessner, P.A. 代理人 Schwegman, Lundberg & Woessner, P.A.
主权项 1. An array of transistors comprising: a crystalline substrate; a plurality of transistors in rows and columns on the crystalline substrate, wherein row spacing between adjacent rows and column spacing between adjacent columns is determined by a minimum feature size (F) for a lithographic process; and each transistor in the transistor array comprises: a first source/drain region in the crystalline substrate;a semiconductor pillar on the crystalline substrate in contact with the first source/drain region, the semiconductor pillar having a cross-sectional dimension in a direction substantially parallel with a surface of the substrate that is less than the minimum feature size F;a second source/drain region in a top portion of the semiconductor pillar;a gate insulator around the semiconductor pillar; anda surrounding gate around and separated from the semiconductor pillar by the gate insulator.
地址 Boise ID US