| 发明名称 | Semiconductor device including test circuit and burn-in test method | ||
| 摘要 | A semiconductor device includes a test circuit configured to generate a buffer control signal in response to input data, decode test commands in response to the buffer control signal, and generate test mode signals and a counting enable signal for counting row addresses and column addresses; and a data input/output circuit configured to buffer external commands in response to the buffer control signal and generate the test commands, perform a burn-in test in response to the test mode signals, and perform a read operation for memory cells corresponding to the row addresses and the column addresses. | ||
| 申请公布号 | US8804444(B2) | 申请公布日期 | 2014.08.12 |
| 申请号 | US201213453467 | 申请日期 | 2012.04.23 |
| 申请人 | SK Hynix Inc. | 发明人 | Cho Jin Hee |
| 分类号 | G11C7/00 | 主分类号 | G11C7/00 |
| 代理机构 | William Park & Associates Patent Ltd. | 代理人 | William Park & Associates Patent Ltd. |
| 主权项 | 1. A semiconductor device comprising: a test circuit configured to generate a buffer control signal in response to input data inputted through a data pad, decode test commands inputted in response to the buffer control signal, and generate test mode signals and a counting enable signal for counting row addresses and column addresses; and a data input/output circuit configured to buffer external commands in response to the buffer control signal and generate the test commands, perform a burn-in test in response to the test mode signals, and perform a read operation for memory cells corresponding to the row addresses and the column addresses. | ||
| 地址 | Gyeonggi-do KR | ||