| 发明名称 | Test element group and semiconductor device | ||
| 摘要 | A device with a plurality of elements separated into groups, each element including an activation terminal, an input terminal and an output terminal, a plurality of first signal lines, and a plurality of second signal lines, where the input terminals of each element in each group are commonly connected to one of the plurality of first signal lines, the input terminals of the different groups are connected to different first signal lines, and the output terminals of the each element in each group are independently connected to a different one of the plurality of second signal lines. | ||
| 申请公布号 | US8805637(B2) | 申请公布日期 | 2014.08.12 |
| 申请号 | US201113071689 | 申请日期 | 2011.03.25 |
| 申请人 | Sony Corporation | 发明人 | Bairo Masaaki |
| 分类号 | G01R31/14 | 主分类号 | G01R31/14 |
| 代理机构 | Dentons US LLP | 代理人 | Dentons US LLP |
| 主权项 | 1. A device comprising: a plurality of elements separated into groups, each element including an activation terminal, an input terminal and an output terminal; first signal lines; second signal lines; and third signal lines, wherein, for each group, the input terminals of each element are commonly connected to one of the first signal lines, for each group, the each activation terminal is independently connected to one of the third signal lines, and for each group, each output terminal is independently connected to one of the second signal lines or one of the first signal lines to which the input terminal of elements of a different group are connected. | ||
| 地址 | Tokyo JP | ||