发明名称 Non-volatile semiconductor storage device
摘要 According to one embodiment, there is provided a non-volatile semiconductor storage device including a non-volatile memory, a monitoring section, a determining section, and a notification processing section. The non-volatile memory includes a plurality of memory cells driven by word lines and a voltage generating section that generates a read voltage to be applied to the word lines. The monitoring section monitors a change in a threshold distribution of the plurality of memory cells upon performing a read processing to read data from the plurality of memory cells by applying the read voltage to the word lines. The determining section determines a degree of deterioration of the non-volatile memory in accordance with a monitoring result by the monitoring section. The notification processing section notifies a life of the non-volatile memory in accordance with a determining result by the determining section.
申请公布号 US8804435(B2) 申请公布日期 2014.08.12
申请号 US201213531791 申请日期 2012.06.25
申请人 Kabushiki Kaisha Toshiba 发明人 Matsunaga Naoki
分类号 G11C11/34 主分类号 G11C11/34
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A non-volatile semiconductor storage device comprising: a non-volatile memory including a plurality of memory cells driven by word lines and a voltage generating section that generates a read voltage to be applied to the word lines; a monitoring section that monitors a change in a threshold distribution of the plurality of memory cells upon performing a read processing to read data from the plurality of memory cells by applying the read voltage to the word lines; a determining section that determines a degree of deterioration of the non-volatile memory in accordance with a monitoring result by the monitoring section; and a notification processing section that notifies a life of the non-volatile memory in accordance with a determining result by the determining section.
地址 Tokyo JP