发明名称 Impedance mismatch detection circuit
摘要 A comparison circuit for detecting impedance mismatch between pull-up and pull-down devices in a circuit to be monitored includes a comparator operative to receive first and second signals and to generate, as an output, a third signal indicative of a difference between the first and second signals. A first signal generator is operative to generate the first signal indicative of a difference between reference pull-up and pull-down currents that is scaled by a prescribed amount. The reference pull-up current is indicative of a current flowing through at least one corresponding pull-up transistor device in the circuit to be monitored. The pull-down reference current is indicative of a current flowing through at least one corresponding pull-down transistor device in the circuit to be monitored. A second signal generator connected with the second input of the comparator is operative to generate the second signal as a reference voltage defining a prescribed impedance mismatch threshold associated with the circuit to be monitored.
申请公布号 US8803535(B2) 申请公布日期 2014.08.12
申请号 US201113171725 申请日期 2011.06.29
申请人 LSI Corporation 发明人 Kothandaraman Makeshwar;Kumar Pankaj;Parameswaran Pramod
分类号 G01R27/26;H03F3/45 主分类号 G01R27/26
代理机构 Otterstedt, Ellenbogen & Kammer, LLP 代理人 Otterstedt, Ellenbogen & Kammer, LLP
主权项 1. A comparison circuit for detecting impedance mismatch between pull-up and pull-down devices in a circuit to be monitored, the comparison circuit comprising: a comparator operative to receive first and second signals and to generate, as an output of the comparison circuit, a third signal indicative of a difference between the first and second signals; a first signal generator connected with a first input of the comparator and operative to generate the first signal indicative of a difference between reference pull-up and pull-down currents that is scaled by a prescribed amount, the reference pull-up current being indicative of a current flowing through at least one corresponding pull-up transistor device in the circuit to be monitored, the reference pull-down current being indicative of a current flowing through at least one corresponding pull-down transistor device in the circuit to be monitored; and a second signal generator connected with a second input of the comparator and operative to generate the second signal as a reference voltage defining a prescribed impedance mismatch threshold associated with the circuit to be monitored.
地址 San Jose CA US