发明名称 |
Apparatuses, systems, devices, and methods of replacing at least partially non-functional portions of memory |
摘要 |
Subject matter disclosed herein relates to determining that a portion of a memory is at least partially non-functional, replacing the portion of at least partially non-functional memory; and adjusting an error detection and/or correction process responsive to determining that the portion of the memory is at least partially non-functional and/or replacing the portion of at least partially non-functional memory. |
申请公布号 |
US8806303(B2) |
申请公布日期 |
2014.08.12 |
申请号 |
US201314055405 |
申请日期 |
2013.10.16 |
申请人 |
Micron Technology, Inc. |
发明人 |
Bueb Chris;Eilert Sean |
分类号 |
G11C29/00;H03M13/00 |
主分类号 |
G11C29/00 |
代理机构 |
Knobbe Martens Olson & Bear, LLP |
代理人 |
Knobbe Martens Olson & Bear, LLP |
主权项 |
1. A method for operating a memory device, comprising:
determining that a portion of a memory is at least partially non-functional; replacing the portion of at least partially non-functional memory with a portion of memory allocated to error detection and/or error correction, thereby decreasing a total amount of memory allocated to error detection and/or error correction from an original level, wherein the total amount of memory allocated to error detection and/or error correction does not increase after being decreased; and adjusting an error detection and/or error correction process responsive to the decrease in the total amount of memory allocated to error detection and/or error correction. |
地址 |
Boise ID US |