发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To make it easy to perform various types of inspection such as analysis by using different materials used for bonding wires; and improve a security function by using different materials used for bonding wires.SOLUTION: A semiconductor device comprises: a stage 1; a first lead 2A; a second lead 2B; a semiconductor chip 3 which is mounted on the stage and has a first bonding pad 4A and a second bonding pad 4B; a first bonding wire 5A for connecting the first bonding pad and the first lead; a second bonding wire 5B for connecting the second bonding pad and the second lead; and an encapsulation resin 6 for encapsulating the semiconductor chip. The first bonding wire is composed of a first metal which is not melted by a medicinal solution which dissolves the encapsulation resin at the time of opening and the second bonding wire is composed of a second metal which is melted by the medicinal solution which dissolves the encapsulation resin at the time of opening. |
申请公布号 |
JP2014143271(A) |
申请公布日期 |
2014.08.07 |
申请号 |
JP20130010212 |
申请日期 |
2013.01.23 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
SAWAI ICHIJI;OZAWA HIROYUKI |
分类号 |
H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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