| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for measuring thickness in whole range of an envelope after enclosing and sealing for inspecting presence of an unexpected foreign material in the envelope.SOLUTION: A foreign material inspection device 1 of one embodiment comprises: a nip roller 10 for nipping whole width of an envelope 2 by a drive roller 10b and a driven roller 10a and conveying; a parallel plate 11 having a parallel plane 11a opposed to the nip roller 10 and pivotally supporting both ends of the driven roller 10a with a pivotally supporting member 11b; a damper 12 suspended from the parallel plate 11 and supporting the parallel plate 11; a displacement sensor 13 for measuring displacement of the parallel plane 11a in a vertical direction; and an inspection control part 14 for determining mixing-in of a foreign material 2a based on an inspection waveform which is an output waveform of the displacement sensor 13 when the envelope 2 after enclosing and sealing is conveyed by the nip roller 10. |
