INSPECTION OF HIDDEN STRUCTURE

摘要

An inspection apparatus determines information indicative of structure that may be hidden behind an obscuring boundary, such as a wall. A processor collects measurements of properties characterizing the hidden structure and measurements of location of the apparatus. The collected data are mapped to produce an image of intensity in the characteristic measurements. Each intensity value in the image reflects a measure of density, of material type, or of some other specific information by which hidden structure can be discerned. The intensity changes indicating the hidden structure are displayed to a user via color-coded pixels or the like.

主权项

1. An apparatus to inspect a region of interest for hidden structure therein, the apparatus comprising:
at least one sensor to generate a characteristic signal at a measurement location on a surface in the region of interest, the measurement location being bound by a sensor area over which a sampling function of the sensor and at least one structural characteristic in the region of interest establishes an attribute of the characteristic signal; a processor to generate a plurality of numerical values from the characteristic signal for respective map locations of a data map, the map locations corresponding to respective physical locations in the region of interest, each numerical value being weighted by the sampling function based a position of the corresponding physical location relative to the measurement location; and a display to generate a two-dimensional visual image from the data map.