Systems and Methods for X-Ray Source Weight Reduction

摘要

The present specification discloses an X-ray scanning system having a shield surrounding an X-ray source of an X-ray inspection system, the shield comprising a first material or a combination of the first material and a second material; and a thickness that keeps a radiation dose below a predefined limit at a plurality of locations on a boundary of a defined exclusion zone, wherein the plurality of locations change as the X-ray source moves in a scan direction, and wherein the thickness of the shield varies non-uniformly as a function of a plurality of angles of radiation. In another embodiment, the shield comprises a first inner material and a second outer material; and a thickness and a contour that keeps a radiation dose below a predefined limit at a plurality of locations on a boundary of a defined exclusion zone, wherein the plurality of locations change as the X-ray source moves in a scan direction, and wherein the thickness and contour of the shield varies non-uniformly as a function of a plurality of angles of radiation.

主权项

1. A method of determining a thickness of shielding surrounding an X-ray source of an X-ray inspection system, said shielding being of a first material or a combination of said first material and a second material, the method comprising the steps of:
defining an exclusion zone; calculating a radiation dose at a plurality of locations on a boundary of said exclusion zone, wherein said plurality of locations change as the X-ray source moves in a scan direction; and calculating the thickness of said shield corresponding to each of said plurality of locations such that said thickness keeps said radiation dose below a predefined limit at each of said plurality of locations.