发明名称 INSTRUMENT DOCKING APPARATUS, SYSTEMS, AND METHODS
摘要 <p>An instrument docking apparatus is provided. The instrument docking apparatus includes a docking base, a guide track, a guide pin configured to ride in the guide track, one or more capture members, wherein each capture member has a capture recess, and one or more alignment pins are operable to be received in the capture recess to capture an instrument in a defined spatial position and orientation. Instrument docking systems and methods of aligning instruments are provided, as are other aspects.</p>
申请公布号 WO2014121216(A1) 申请公布日期 2014.08.07
申请号 WO2014US14485 申请日期 2014.02.03
申请人 SIEMENS HEALTHCARE DIAGNOSTICS INC. 发明人 EDENS, JOHN;KUTNIEWSKI, STEVEN;DURAN, ALFREDO
分类号 G01N35/00 主分类号 G01N35/00
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