发明名称 ION IMPLANTATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for forming an ion implanted region in a semiconductor device.SOLUTION: The method comprises the steps of: (a) providing a semiconductor substrate having a plurality of regions to be ion implanted; (b) forming a photoresist pattern on the semiconductor substrate, in which the photoresist pattern is formed from a chemically amplified photoresist composition comprising a matrix polymer having an acid-labile group, a photoacid generator and a solvent; (c) applying a descumming composition over the photoresist pattern, in which the descumming composition comprises a matrix polymer, an acid generator and a solvent; (d) subjecting the coated semiconductor substrate to the conditions to generate an acid from the acid generator into the descumming composition; (e) bringing the coated semiconductor substrate with a rinsing agent to remove a residual descumming composition and scum from the substrate; and (f) ion implanting the plurality of regions of the semiconductor substrate using the photoresist pattern as an implant mask.
申请公布号 JP2014143415(A) 申请公布日期 2014.08.07
申请号 JP20130273154 申请日期 2013.12.27
申请人 ROHM & HAAS ELECTRONIC MATERIALS LLC 发明人 CHENG BAI SU;WU CHENG HAN;CHUNG DONG WON;YAMAMOTO YOSHIHIRO;BARCLAY GEORGE G;GERHARD POHLERS
分类号 H01L21/266;G03F7/40;H01L21/027 主分类号 H01L21/266
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