发明名称 |
SUBSTRATE PROCESSING DEVICE, SEMICONDUCTOR MANUFACTURING METHOD AND SUBSTRATE PROCESSING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To improve an operation rate of a substrate processing device by reducing maintenance frequency of cumulative film removal.SOLUTION: A substrate processing device comprises: a processing chamber 34 for accommodating a substrate holder 13 which holds a substrate 2, therein and forming a film over the substrate; heating means 32 for heating the substrate and an atmosphere within the processing chamber; gas supply means 35a, 35b for supplying gas into the processing chamber; gas exhaust means 42 for exhausting the gas out of the processing chamber; transfer means for transferring the substrate to the substrate holder; and a control section 31 for controlling the heating means, the gas supply means, the gas exhaust means and the transfer means so as to perform in parallel a transfer step of transferring the substrate from the substrate holder carried out of the processing chamber, and a foreign substance removal step of removing foreign substances within the processing chamber by raising a temperature within the processing chamber to a first temperature exceeding a processing temperature at which the substrate is processed, then lowering the temperature to a second temperature lower than the processing temperature and repeating pressure rise and fall within the processing chamber.</p> |
申请公布号 |
JP2014143421(A) |
申请公布日期 |
2014.08.07 |
申请号 |
JP20140024277 |
申请日期 |
2014.02.12 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
ASAI MASAYUKI;OKUDA KAZUYUKI;MIZUNO KANEKAZU;NAKAISO NAOHARU;HANASHIMA TAKEO |
分类号 |
H01L21/31;C23C16/44;H01L21/318;H05H1/46 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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