发明名称 METHOD TO REDUCE DISLOCATIONS IN SIC CRYSTAL GROWTH
摘要 A method of forming an SiC crystal including placing a seed crystal of SiC in an insulated graphite container; placing a source of Si and C atoms in the insulated graphite container, where the source of Si and C atoms is for transport to the seed crystal to grow the SiC crystal; placing the container into the furnace; heating a furnace to a temperature from about 2,000° C. to about 2,500° C.; evacuating the furnace to a pressure from about 0.1 Torr and about 100 Torr; filling the furnace with an inert gas; and introducing dopant gas into the furnace with a controlled flow so as to form a plurality of stratified layers wherein each layer has dopant concentration different from a layer directly below and a layer directly above it. A 4H-SiC crystal made by the method. A 4H-SiC substrate cut from the SiC crystal made from the method.
申请公布号 US2014220325(A1) 申请公布日期 2014.08.07
申请号 US201313937149 申请日期 2013.07.08
申请人 Dow Corning Corporation 发明人 Loboda Mark
分类号 C30B23/00;C30B29/36 主分类号 C30B23/00
代理机构 代理人
主权项
地址 Midland MI US