发明名称 NONVOLATILE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 In a nonvolatile memory device and a method for fabricating the same, a device comprises a substrate, a trench in the substrate and a first gate pattern comprising a first bottom gate electrode having a first portion in the trench and having a second portion on the first portion and protruding in an upward direction relative to an upper surface of the substrate. A second gate pattern comprising a second gate electrode is on the substrate at a side of the first gate pattern and insulated from the first gate pattern. An impurity region is present in the substrate at a side of the first gate pattern opposite the second gate pattern, and overlapping part of the trench.
申请公布号 US2014217490(A1) 申请公布日期 2014.08.07
申请号 US201313803791 申请日期 2013.03.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Seo Bo-Young;Park Weon-Ho;Jeon Chang-Min;Cho Yong-Sang
分类号 H01L29/788 主分类号 H01L29/788
代理机构 代理人
主权项 1. A nonvolatile memory device comprising: a substrate; a trench in the substrate; a first gate pattern comprising a first bottom gate electrode having a first portion in the trench and having a second portion on the first portion and protruding in an upward direction relative to an upper surface of the substrate; a second gate pattern comprising a second gate electrode on the substrate at a side of the first gate pattern and insulated from the first gate pattern; an inter-pattern spacer on a side of the first gate pattern contacting the second gate pattern; and an impurity region in the substrate at a side of the first gate pattern opposite the second gate pattern, and overlapping part of the trench.
地址 Suwon-si KR