发明名称 |
NONVOLATILE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
In a nonvolatile memory device and a method for fabricating the same, a device comprises a substrate, a trench in the substrate and a first gate pattern comprising a first bottom gate electrode having a first portion in the trench and having a second portion on the first portion and protruding in an upward direction relative to an upper surface of the substrate. A second gate pattern comprising a second gate electrode is on the substrate at a side of the first gate pattern and insulated from the first gate pattern. An impurity region is present in the substrate at a side of the first gate pattern opposite the second gate pattern, and overlapping part of the trench. |
申请公布号 |
US2014217490(A1) |
申请公布日期 |
2014.08.07 |
申请号 |
US201313803791 |
申请日期 |
2013.03.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Seo Bo-Young;Park Weon-Ho;Jeon Chang-Min;Cho Yong-Sang |
分类号 |
H01L29/788 |
主分类号 |
H01L29/788 |
代理机构 |
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代理人 |
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主权项 |
1. A nonvolatile memory device comprising:
a substrate; a trench in the substrate; a first gate pattern comprising a first bottom gate electrode having a first portion in the trench and having a second portion on the first portion and protruding in an upward direction relative to an upper surface of the substrate; a second gate pattern comprising a second gate electrode on the substrate at a side of the first gate pattern and insulated from the first gate pattern; an inter-pattern spacer on a side of the first gate pattern contacting the second gate pattern; and an impurity region in the substrate at a side of the first gate pattern opposite the second gate pattern, and overlapping part of the trench. |
地址 |
Suwon-si KR |