发明名称 |
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, LEAD, AND METHOD OF MANUFACTURING LEAD |
摘要 |
PROBLEM TO BE SOLVED: To improve the reliability of a semiconductor device.SOLUTION: A semiconductor device comprises: an FET chip 10; a plurality of pads 12-16 provided on an upper surface 11 of the FET chip 10; a plurality of bumps 40 provided on at least one of the pads 12-16; a first portion 44 to which the FET chip 10 is connected through the bumps 40, and which extends along the upper surface 11 of the FET chip 10; a second portion 46 which is in contact with a surface 41 along the upper surface 11 of the FET chip 10 in the first portion 44, and which extends along a side surface 13 of the FET chip 10; leads 42a-42c formed by press work or cutting work; and a sealing portion 48 which seals the FET chip 10 and the leads 42a-42c, and which exposes the second portions 46 of the leads 42a-42c from the side of a lower surface 15 of the FET chip 10. |
申请公布号 |
JP2014143326(A) |
申请公布日期 |
2014.08.07 |
申请号 |
JP20130011458 |
申请日期 |
2013.01.24 |
申请人 |
TRANSPHORM JAPAN INC |
发明人 |
NAKAMURA KOICHI |
分类号 |
H01L23/50;H01L21/60;H01L23/28;H01L23/48;H01L25/10;H01L25/11;H01L25/18 |
主分类号 |
H01L23/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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