发明名称 SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, LEAD, AND METHOD OF MANUFACTURING LEAD
摘要 PROBLEM TO BE SOLVED: To improve the reliability of a semiconductor device.SOLUTION: A semiconductor device comprises: an FET chip 10; a plurality of pads 12-16 provided on an upper surface 11 of the FET chip 10; a plurality of bumps 40 provided on at least one of the pads 12-16; a first portion 44 to which the FET chip 10 is connected through the bumps 40, and which extends along the upper surface 11 of the FET chip 10; a second portion 46 which is in contact with a surface 41 along the upper surface 11 of the FET chip 10 in the first portion 44, and which extends along a side surface 13 of the FET chip 10; leads 42a-42c formed by press work or cutting work; and a sealing portion 48 which seals the FET chip 10 and the leads 42a-42c, and which exposes the second portions 46 of the leads 42a-42c from the side of a lower surface 15 of the FET chip 10.
申请公布号 JP2014143326(A) 申请公布日期 2014.08.07
申请号 JP20130011458 申请日期 2013.01.24
申请人 TRANSPHORM JAPAN INC 发明人 NAKAMURA KOICHI
分类号 H01L23/50;H01L21/60;H01L23/28;H01L23/48;H01L25/10;H01L25/11;H01L25/18 主分类号 H01L23/50
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