发明名称 Doping Control of Metal Nitride Films
摘要 Described are methods for controlling the doping of metal nitride films such as TaN, TiN and MnN. The temperature during deposition of the metal nitride film may be controlled to provide a film density that permits a desired amount of doping. Dopants may include Ru, Cu, Co, Mn, Mo, Al, Mg, Cr, Nb, Ta, Ti and V. The metal nitride film may optionally be exposed to plasma treatment after doping.
申请公布号 US2014220772(A1) 申请公布日期 2014.08.07
申请号 US201414169937 申请日期 2014.01.31
申请人 Lakshmanan Annamalai;Sheu Ben-Li;Wei Guodan;Lundy Nicole;Ma Paul F. 发明人 Lakshmanan Annamalai;Sheu Ben-Li;Wei Guodan;Lundy Nicole;Ma Paul F.
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method for depositing a doped metal nitride film on a substrate, the method comprising: depositing a metal nitride film on the substrate at a temperature selected to provide a film having a predetermined film density; and exposing the metal nitride film to a dopant metal precursor to form a doped metal nitride film.
地址 Fremont CA US