<p>A system and method for dynamically modifying scheduling of scan operations for a system under test includes a processing module configured to apply input test data to the system under test based on the scan operations via a test access port and a scheduler adapted to provide the processing module with scheduling for the plurality of scan operations. The scheduler includes a circuit model of the system under test. The circuit model includes at least one attribute providing enhancing information for at least a portion of the system under test. The scheduler is adapted to schedule the scan operations based on the circuit model and to modify the schedule based on the at least one attribute. The processing module is configured to receive the modified scheduled scan operations and to apply the input test data to the system under test based on the modified scheduled scan operations.</p>
申请公布号
WO2014120489(A1)
申请公布日期
2014.08.07
申请号
WO2014US12158
申请日期
2014.01.20
申请人
ALCATEL-LUCENT USA INC.;ALCATEL LUCENT
发明人
VAN TREUREN, BRADFORD, G.;GOYAL, SURESH;PORTOLAN, MICHELE