发明名称 |
MEMORY ELEMENT, SEMICONDUCTOR DEVICE AND WRITING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To obtain a memory element capable of enhancing reliability of information having been memorized, when the memory element is configured by using both an electric fuse and an anti-fuse.SOLUTION: A memory element includes: an electric fuse 11 inserted between a first input node and a second input node; and an anti-fuse 12 inserted between the second input node and a third input node configured so that a voltage different from a voltage applied on the first input node can be applied thereon. Different voltages can be applied on the first input node and the third input node, so that reliability of information having been memorized can be enhanced.</p> |
申请公布号 |
JP2014143284(A) |
申请公布日期 |
2014.08.07 |
申请号 |
JP20130010433 |
申请日期 |
2013.01.23 |
申请人 |
SONY CORP |
发明人 |
KANDA YASUO;AMARI KOICHI;TOKITO SHUNSAKU;TORIGE YUJI;ARIMA TAKAYUKI |
分类号 |
H01L27/105;G11C17/14;H01L21/82;H01L27/10;H01L45/00;H01L49/00 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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