CONNECTOR FOR TESTING SEMICONDUCTOR DEVICE

摘要

The present invention relates to an electrical connection device for testing a semiconductor device. The electrical connection device according to the present invention, which is used to test a semiconductor device, includes: multiple elastic pins which can be elastically compressed in the direction of elastic force and electrically connect terminals of the semiconductor device to a tester; and a support member which supports the elastic pins to compress those pins elastically. Each of the elastic pins has the center part excluding both ends inserted into the support member, and the support member is in contact with all of the outer surfaces of the center part of each elastic pin. The support member is made of an insulation material which can be elastically deformed. The present invention can reliably test the electrical attributes of a semiconductor device and be used for an extended period of time. The present invention can also minimize the damage done to a semiconductor device product being tested.