发明名称 Method and Apparatus for a Seal Ring Structure
摘要 A wafer seal ring may be formed on a first and/or a second wafer. One or both of the first and/or second wafers may have one or more dies formed thereon. The wafer seal ring may be formed to surround the dies of a corresponding wafer. One or more die seal rings may be formed around the one or more dies. The wafer seal ring may be formed to a height that may be approximately equal to a height of one or more die seal rings formed on the first and/or second wafer. The wafer seal ring may be formed to provide for eutectic or fusion bonding processes. The first and second wafers may be bonded together to form a seal ring structure between the first and second wafers. The seal ring structure may provide a hermetic seal between the first and second wafers.
申请公布号 US2014217557(A1) 申请公布日期 2014.08.07
申请号 US201313759549 申请日期 2013.02.05
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Chen Ting-Ying;Chiu Yi Hsun;Su Ching-Hou;Ni Chyi-Tsong
分类号 H01L23/00 主分类号 H01L23/00
代理机构 代理人
主权项 1. An apparatus comprising: a pair of bonded wafers, at least one of the wafers having a plurality dies formed thereon; a plurality of die seal rings, wherein each of the die seal rings is formed around a respective one each of the plurality of dies; and a wafer seal ring between the bonded wafers, the wafer seal ring having a uniform width, wherein the wafer seal ring is formed to surround the plurality of die seal rings.
地址 Hsin-Chu TW