| 发明名称 |
MEASUREMENT METHOD |
| 摘要 |
A method of locating a feature of an object in which the method includes bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object. Each which the measurements gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length. The at least first and second measurements are used to reduce the extent of said uncertainty which includes using stylus orientation related information associated with the at least first and second measurements. |
| 申请公布号 |
US2014215841(A1) |
申请公布日期 |
2014.08.07 |
| 申请号 |
US201214350264 |
申请日期 |
2012.10.03 |
| 申请人 |
RENISHAW PLC |
发明人 |
Danbury Richard Neil;Wallace David Sven |
| 分类号 |
G01B5/008 |
主分类号 |
G01B5/008 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of locating a feature of an object comprising:
bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object, each of which gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length, and using the at least first and second measurements to at least reduce the extent of said uncertainty comprising using known stylus orientation related information associated with the at least first and second measurements. |
| 地址 |
Wotton-under-Edge, Gloucestershire GB |
