发明名称 FIXED STATE MEASURING INSTRUMENT FOR EQUIPMENT AND MEASURING SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide a fixed state measuring instrument for equipment which improves durability after installation even in the environment where vibration/shock from the outside is received, reduces time and efforts for maintenance by keeping a state after installation for a long time, and detects a mounted state by being easily installed subsequently even to existing equipment, and a measuring system.SOLUTION: The fixed state measuring instrument measures a fixed state of a measurement object fixed on the ceiling or the wall or detects abnormality in the fixed state. The fixed state measuring instrument comprises a spring-type displacement gauge 1 which is formed from a bent elastic bending plate and of which the proximal part is fixed to the ceiling or the wall and the bent distal part is locked to the measurement object. An elongation/contraction detector is fixed on a plate surface in the vicinity of a bent part of the elastic bending plate, the elastic bending plate is elastically deformed by reacting the distal part of the spring-type displacement gauge in response to displacing movement of the measurement object with respect to the ceiling or the wall, and the elongation/contraction detector detects elastic deformation of a cabinet.</p>
申请公布号 JP2014142287(A) 申请公布日期 2014.08.07
申请号 JP20130011572 申请日期 2013.01.25
申请人 NAKANIHON HIGHWAY ENGINEERING NAGOYA KK;TRUST INC 发明人 HIGASHI MASAKATSU ; TABUCHI MASAO ; YAZAKI KENICHI ; TANIGUCHI HIROSHI ; OBATA KOICHIRO
分类号 G01B7/16 主分类号 G01B7/16
代理机构 代理人
主权项
地址