| 发明名称 |
DETECTING EARLY FAILURES IN PRINTED WIRING BOARDS |
| 摘要 |
A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields. |
| 申请公布号 |
US2014218065(A1) |
申请公布日期 |
2014.08.07 |
| 申请号 |
US201313886927 |
申请日期 |
2013.05.03 |
| 申请人 |
HAMILTON SUNDSTRAND CORPORATION |
发明人 |
Said Waleed M.;Hansen Harold J.;Kozlu Hamdi;DeSantis Charles V. |
| 分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data; using the test data to determine a dielectric life curve of the first set of PWBs; and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields. |
| 地址 |
Windsor Locks CT US |
