发明名称 TRENCH ISOLATION FOR BICMOS BIPOLAR JUNCTION TRANSISTORS
摘要 <p>Device structures, fabrication methods, and design structures for a bipolar junction transistor. A first isolation structure is formed in a substrate to define a boundary for a device region. A collector is formed in the device region, and a second isolation structure is formed in the device region. The second isolation structure defines a boundary for the collector. The second isolation structure is laterally positioned relative to the first isolation structure to define a section of the device region between the first and second isolation structures.</p>
申请公布号 WO2014121022(A1) 申请公布日期 2014.08.07
申请号 WO2014US14056 申请日期 2014.01.31
申请人 INTERNATIONAL BUSINSS MACHINES CORPORATION 发明人 DUNN, JAMES, S.;LIU, QIZHI
分类号 H01L29/70;H01L21/02;H01L21/8222 主分类号 H01L29/70
代理机构 代理人
主权项
地址