发明名称 Improved low resistance contacts for semiconductor devices
摘要 The invention provides a method of forming at least one Metal Germanide contact on a Germanium (Ge) substrate for providing a semiconducting device (100) by providing a first layer (120) of Germanium (Ge) and a second layer of metal. The invention provides a step of reacting the second layer with the first layer with high energy density pulses for obtaining a Germanide metal layer (160A) having a substantially planar interface with the underlying first (Ge) layer.
申请公布号 EP2763159(A1) 申请公布日期 2014.08.06
申请号 EP20130153312 申请日期 2013.01.30
申请人 UNIVERSITY COLLEGE CORK;EXCICO FRANCE 发明人 DUFFY, RAY;SHAYESTEH, MARYAM;HUET, KARIM
分类号 H01L21/285;H01L21/268 主分类号 H01L21/285
代理机构 代理人
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