发明名称 APPARATUS AND METHOD FOR MEASURING PERFORMANCE OF PROTECTION CIRCUIT
摘要 The present invention provides a method for obtaining objective and consistent characteristic results of various TVS devices by excluding a deviation of a measurement environment since a deviation between waveforms obtained by measuring electrostatic discharge characteristics is high depending on the measurement environment in the TVS device. To achieve this, the method of the present invention comprises a process of outputting a predetermined reference pulse signal to a protection device; a process of measuring a voltage and a current outputted from the protection device; a process of obtaining a voltage value and a current value at a peak time when the measured voltage is the highest; and a process of generating and storing a characteristic curve between the current and the voltage of the protection device using the obtained voltage value and current value, thereby selecting the type of the TVS device suitable for characteristics of equipment based on objective data, that is, the characteristic curve between the current and the voltage of each TVS device without being affected by the measurement environment.
申请公布号 KR20140096678(A) 申请公布日期 2014.08.06
申请号 KR20130009536 申请日期 2013.01.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, HAN AWL;CHOI, WOONG HAE;LEE, JAE KYU;LEE, BYOUNG HEE
分类号 G01R29/12;G01R19/175 主分类号 G01R29/12
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