发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 A method for manufacturing a silicon carbide semiconductor device, comprising the steps of: preparing a silicon carbide semiconductor including a first surface having at least a portion into which an impurity is implanted; forming a second surface thereof by cleaning said first surface of said silicon carbide semiconductor; forming a silicon-containing film on said second surface; and forming an oxide film constituting the silicon carbide semiconductor device, by oxidizing said silicon-containing film, said first surface being cleaned by means of a process for forming an oxide film on said first surface using at least one of a solution containing oxygen, thermal oxidation in an atmosphere containing oxygen gas, and oxygen plasma, and then removing said oxide film.
申请公布号 EP2584595(A4) 申请公布日期 2014.08.06
申请号 EP20110795442 申请日期 2011.02.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 ITOH, SATOMI;SHIOMI, HIROMU;NAMIKAWA, YASUO;WADA, KEIJI;SHIMAZU, MITSURU;HIYOSHI, TORU
分类号 H01L21/28;H01L21/336;H01L29/16 主分类号 H01L21/28
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