发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
A method for manufacturing a silicon carbide semiconductor device, comprising the steps of: preparing a silicon carbide semiconductor including a first surface having at least a portion into which an impurity is implanted; forming a second surface thereof by cleaning said first surface of said silicon carbide semiconductor; forming a silicon-containing film on said second surface; and forming an oxide film constituting the silicon carbide semiconductor device, by oxidizing said silicon-containing film, said first surface being cleaned by means of a process for forming an oxide film on said first surface using at least one of a solution containing oxygen, thermal oxidation in an atmosphere containing oxygen gas, and oxygen plasma, and then removing said oxide film. |
申请公布号 |
EP2584595(A4) |
申请公布日期 |
2014.08.06 |
申请号 |
EP20110795442 |
申请日期 |
2011.02.25 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
ITOH, SATOMI;SHIOMI, HIROMU;NAMIKAWA, YASUO;WADA, KEIJI;SHIMAZU, MITSURU;HIYOSHI, TORU |
分类号 |
H01L21/28;H01L21/336;H01L29/16 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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