发明名称 |
Optical system for inspecting porous substrates |
摘要 |
An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate. |
申请公布号 |
US8797395(B2) |
申请公布日期 |
2014.08.05 |
申请号 |
US201012972167 |
申请日期 |
2010.12.17 |
申请人 |
General Electric Company |
发明人 |
Harding Kevin George;Williams Yana Zhang;Heidari Esmaeil |
分类号 |
G02B21/00;G01N21/84;G02B21/36 |
主分类号 |
G02B21/00 |
代理机构 |
|
代理人 |
Haeckl Jenifer E. |
主权项 |
1. An automated system for inspecting a porous substrate using a sample, comprising,
a delivery device fixed along a sample axis to apply a sample to a target point on a porous substrate, wherein the sample axis is perpendicular to the porous substrate; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is parallel but offset translationally from the sample axis, and the combination of the imaging device and the lens has a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate. |
地址 |
Niskayuna NY US |