发明名称 Optical system for inspecting porous substrates
摘要 An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
申请公布号 US8797395(B2) 申请公布日期 2014.08.05
申请号 US201012972167 申请日期 2010.12.17
申请人 General Electric Company 发明人 Harding Kevin George;Williams Yana Zhang;Heidari Esmaeil
分类号 G02B21/00;G01N21/84;G02B21/36 主分类号 G02B21/00
代理机构 代理人 Haeckl Jenifer E.
主权项 1. An automated system for inspecting a porous substrate using a sample, comprising, a delivery device fixed along a sample axis to apply a sample to a target point on a porous substrate, wherein the sample axis is perpendicular to the porous substrate; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is parallel but offset translationally from the sample axis, and the combination of the imaging device and the lens has a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
地址 Niskayuna NY US