Method, electric circuit arrangement and electric memory unit for determining a characteristic status parameter of the memory unit

摘要

The invention relates to a method for determining a characteristic status parameter of a memory unit via an electric circuit arrangement. In the circuit arrangement at least one inductive component and at least one capacitive component are arranged, forming a tuned circuit with the memory unit. The method has the following steps of energizing the tend circuit by temporary charging of the capacitive component, the energizing being carried out by an energizing device electrically supplied by the memory unit, and determining a time-dependent voltage change at the capacitive component after terminating the energizing and determining the characteristic status parameter from the time-dependence of the voltage change. The invention further relates to a corresponding electrical circuit arrangement and an electrical memory, including such a circuit arrangement.

主权项

1. A method for determining a characteristic status parameter of a storage unit by means of an electric circuit arrangement in which at least one inductive component and at least one capacitive component, which with the storage unit form an oscillator circuit, are disposed having the following steps:
supplying a voltage produced by the storage unit to an excitation device, the excitation device being connected between the storage unit and the oscillator circuit; activating the excitation circuit to excite the oscillator circuit temporarily; generating a current flow from the excitation device to the oscillator circuit using the voltage in response to activating the excitation circuit, the current flow temporarily subjecting the capacitive component to a charge; ascertaining a time-dependent voltage change at the capacitive component after termination of the excitation; and determining the characteristic status parameter from a time dependency of the voltage change.