发明名称 Selective epitaxial growth of semiconductor materials with reduced defects
摘要 A semiconductor device includes a substrate formed of a first semiconductor material; two insulators on the substrate; and a semiconductor region having a portion between the two insulators and over the substrate. The semiconductor region has a bottom surface contacting the substrate and having sloped sidewalls. The semiconductor region is formed of a second semiconductor material different from the first semiconductor material.
申请公布号 US8796758(B2) 申请公布日期 2014.08.05
申请号 US201213686708 申请日期 2012.11.27
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lin Jing-Cheng;Yu Chen-Hua
分类号 H01L21/02;H01L21/762;H01L29/267;H01L29/165 主分类号 H01L21/02
代理机构 Slater and Matsil, L.L.P. 代理人 Slater and Matsil, L.L.P.
主权项 1. A device comprising: a first semiconductor layer of a first semiconductor material; a first insulator layer disposed on the first semiconductor layer; and a semiconductor region having a first portion disposed in the first insulator layer and a second portion disposed in the first semiconductor layer, the second portion in contact with the first portion and having a width greater than a width of the first portion, and the first portion of a second semiconductor material different from the first semiconductor material.
地址 Hsin-Chu TW