Parallel test payload

摘要

A parallel test payload includes a bit sequence configured to be segmented into a plurality of sub-sequences having variable bit length carriers. Respective carriers are represented uniformly in each one of the plurality of sub-sequences.

主权项

1. A parallel test payload, comprising:
a bit sequence configured to be segmented into a plurality of sub-sequences having variable bit length carriers; and each of the plurality of sub-sequences including:
respective carriers represented uniformly in a respective sub-sequence such that each of the respective carriers is present an equal number of times in the respective sub-sequence; anda number of bits present in each of the respective carriers such that each of the respective carriers in the respective sub-sequence has a bit length that is different than a bit length of any other respective carriers in any other respective sub-sequences; wherein the bit sequence is represented in each of the plurality of sub-sequences through the respective carriers.