发明名称 Sensor device for target particles in a sample
摘要 A sensor device and a method for the determination of the amount of target particles at a contact surface adjacent to a sample chamber include detecting, by a detector, the target particles in the sample chamber by a sensor element, and providing at least one corresponding sensor signal. An evaluation unit determines the amount of target particles in a first zone at the contracts surface and in a second zone a distance away from the contact surface based on this sensor signal. In an optical measurement approach, frustrated total internal reflection taking place under different operating conditions, such as wavelength and/or angle of incidence, may be used to extract information about the first and second zones. In a magnetic measurement approach, different magnetic excitation fields may be used to excite magnetic target particles differently in the first and second zone.
申请公布号 US8797028(B2) 申请公布日期 2014.08.05
申请号 US200812738317 申请日期 2008.10.21
申请人 Koninklijke Philips N.V. 发明人 Verschuren Coen Adrianus Johannes;Kahlman Josephus Arnoldus Henricus Maria;Immink Albert Hendrik Jan;Megens Mischa;Veen Jeroen;De Boer Bart Michiel;Jansen Theodorus Petrus Henricus Gerardus
分类号 G01R33/02;G01N33/00;G01N21/55 主分类号 G01R33/02
代理机构 代理人
主权项 1. A sensor device for determining an amount of target particles at a contact surface of a sample chamber in which a sample with said target particles can be provided, comprising: a sensor element for detecting the target particles in the sample chamber and for providing at least one sensor signal; and an evaluation unit for directly or indirectly determining the amount of target particles in a first zone immediately at the contact surface and in a second zone a distance away from the contact surface based on the at least one sensor signal, wherein the contact surface comprises binding sites for specifically binding the target particles, wherein the sensor element provides at least two sensor signals that are in a different way sensitive for the amount of target particles in the first zone and the second zone, respectively, and wherein a first sensor signal of the at least two sensor signals is measured with a sensitivity which is higher in the first zone than in the second zone, and a second sensor signal of the at least two sensor signals is measured with a sensitivity which is lower in the first zone than in the second zone.
地址 Eindhoven NL