发明名称 Fin-type device system and method
摘要 A method includes forming a gate of a transistor within a substrate having a surface and forming a buried oxide (BOX) layer within the substrate and adjacent to the gate at a first BOX layer face. The method also includes forming a raised source-drain channel (“fin”), where at least a portion of the fin extends from the surface of the substrate, and where the fin has a first fin face adjacent a second BOX layer face of the BOX layer.
申请公布号 US8796777(B2) 申请公布日期 2014.08.05
申请号 US200912552359 申请日期 2009.09.02
申请人 QUALCOMM Incorporated 发明人 Song Seung-Chul;Abu-Rahma Mohamed;Han Beom-Mo
分类号 H01L29/786;H01L29/78 主分类号 H01L29/786
代理机构 代理人 Talpalatsky Sam;Pauley Nicholas J.;Agusta Joseph
主权项 1. An apparatus comprising: a plurality of bit cell memory transistors, wherein each bit cell memory transistor of the plurality of bit cell memory transistors is configured to store a single data bit, wherein each bit cell memory transistor is configured to operate in a hold phase and in a write phase, and wherein each bit cell memory transistor comprises:a fin defining a source-drain channel protruding from a surface of a substrate;a first gate configured to be electrically coupled to a first bias source to receive a first gate voltage, wherein the first gate is adjacent to the fin at a first fin face, and separated from the fin by a buried oxide (BOX) layer;a second gate configured to be electrically coupled to a second bias source to receive a second gate voltage, wherein the second gate is situated adjacent to the fin at a second fin face; anda third gate configured to be electrically coupled to a third bias source to receive a third gate voltage, wherein the third gate is situated adjacent to the fin at a third fin face; a first gate write and hold logic control circuit configured to control the first gate of each bit cell memory transistor; a second gate write and hold logic control circuit configured to control the second gate of each bit cell memory transistor; and a third gate write and hold logic control circuit configured to control the third gate of each bit cell memory transistor, wherein, when a particular bit cell memory transistor operates in the hold phase, the first gate write and hold logic control circuit, the second gate write and hold logic control circuit, and the third gate write and hold logic control circuit are configured to apply low values of the first gate voltage, the second gate voltage, and the third gate voltage to the particular bit cell memory transistor.
地址 San Diego CA US