发明名称 Method for manufacturing semiconductor device with first and second gates over buried bit line
摘要 A semiconductor device and a method for manufacturing the same are provided. The method includes forming a cell structure where a storage node contact is coupled to a silicon layer formed over a gate, thereby simplifying the manufacturing process of the device. The semiconductor device includes a bit line buried in a semiconductor substrate; a plurality of gates disposed over the semiconductor substrate buried with the bit line; a first plug disposed in a lower portion between the gates and coupled to the bit line; a silicon layer disposed on the upper portion and sidewalls of the gate; and a second plug coupled to the silicon layer disposed over the gate.
申请公布号 US8796092(B2) 申请公布日期 2014.08.05
申请号 US201313745635 申请日期 2013.01.18
申请人 SK Hynix Inc. 发明人 Park Hyung Jin
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor device, the method comprising: forming a buried bit line in a substrate; forming first and second gates over the substrate; forming a first plug recessed between the first and second gates; and forming a channel layer over a sidewall of the first and second gates, wherein the first plug is formed to be coupled to the channel layer and the bit line.
地址 Icheon KR