发明名称 |
Method for manufacturing semiconductor device with first and second gates over buried bit line |
摘要 |
A semiconductor device and a method for manufacturing the same are provided. The method includes forming a cell structure where a storage node contact is coupled to a silicon layer formed over a gate, thereby simplifying the manufacturing process of the device. The semiconductor device includes a bit line buried in a semiconductor substrate; a plurality of gates disposed over the semiconductor substrate buried with the bit line; a first plug disposed in a lower portion between the gates and coupled to the bit line; a silicon layer disposed on the upper portion and sidewalls of the gate; and a second plug coupled to the silicon layer disposed over the gate. |
申请公布号 |
US8796092(B2) |
申请公布日期 |
2014.08.05 |
申请号 |
US201313745635 |
申请日期 |
2013.01.18 |
申请人 |
SK Hynix Inc. |
发明人 |
Park Hyung Jin |
分类号 |
H01L29/66 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device, the method comprising:
forming a buried bit line in a substrate; forming first and second gates over the substrate; forming a first plug recessed between the first and second gates; and forming a channel layer over a sidewall of the first and second gates, wherein the first plug is formed to be coupled to the channel layer and the bit line. |
地址 |
Icheon KR |