发明名称 Method of determining minute amounts of additives in polymers
摘要 A method for analyzing a minute quantity of a material included in a different material is performed in short extraction treatment without taking a long time and the minute content is rapidly analyzed. The method of analyzing a minute content includes mounting on a sample table a sample piece of a material having a minute content of a different material to be analyzed; dropping onto the sample table a solvent for extracting the minute content from the sample piece, so that the solvent is disposed between the sample table and the sample piece; maintaining at room temperature the solvent between the sample table and the sample piece, and, with the solvent maintained between the sample table and the sample piece, extracting the material of the minute content from the sample piece; and analyzing the content extracted from the sample piece.
申请公布号 US8796033(B2) 申请公布日期 2014.08.05
申请号 US200410576254 申请日期 2004.10.14
申请人 Mitsubishi Denki Kabushiki Kaisha 发明人 Naka Jiro;Kurokawa Hiroshi;Kobayashi Junji;Toyama Satoru;Hirano Noriko;Hara Eiji
分类号 G01N33/44;G01N1/40;G01N30/00 主分类号 G01N33/44
代理机构 Leydig, Voit & Mayer, Ltd. 代理人 Leydig, Voit & Mayer, Ltd.
主权项 1. A method of determining a previously unknown concentration of a known additive material in a polymer material by analyzing a plurality of samples of the polymer material containing respective known concentrations of the additive material, the method comprising: placing a pellet of one of the samples of the polymer material containing one of the known concentrations of the additive material, the additive material being different from the polymer material, on a face of a substrate, wherein the face of the substrate is one of silver and gold; disposing an organic solvent, which dissolves the additive material contained in the pellet of the polymer material, on the pellet of the polymer material and between the face of the substrate and the pellet of the polymer material; maintaining the organic solvent between the face of the substrate and the pellet of the polymer material at room temperature and dissolving some of the additive material from the pellet of the polymer material in the organic solvent; removing the pellet of the polymer material from the face of the substrate, leaving a residue of the additive material that has been dissolved in the organic solvent on the face of the substrate; subjecting the residue of the additive material that has been left on the face of the substrate to time-of-flight secondary ion mass spectrometry and correlating results of the time-of-flight secondary mass spectrometry with the known concentration of the additive material of the one of the samples of the polymer material that has been analyzed; and repeating the foregoing steps for each of the samples of the polymer material with known concentrations of the additive material and producing a relationship between the results of the time-of-flight secondary ion mass spectrometry for the samples of the polymer material and concentrations of the additive material in the samples of the polymer material with the known concentrations, for determination of the previously unknown concentration of the additive material in the polymer material.
地址 Tokyo JP