| 摘要 |
The present invention relates to a shift resist capable of minimizing the size of an occupying area while improving the reliability or circuit operation, and including a plurality of stages outputting scan pulses through outputting elements. Each stage includes a first switching element which accesses between a set node and a power line for charging for transmitting a charging voltage, and is controlled by the scan pulses from a front stage; a second switching element which accesses between a power line for discharging for transmitting a discharging voltage and the set node, and is controlled by the scan pulses from a back stage; a third switching element which accesses between a first reset node and a first alternating power line, and is controlled by the first alternating current voltage from the first alternating power line; a forth switching element which accesses a second reset node and a second alternating power line, and is controlled by a second alternating current voltage from the second alternating power line; a fifth switching element which accesses between the first reset node and the power line for discharging, and is controlled by the second current voltage; a sixth switching element which accesses between the power line for discharging and the second reset node, and is controlled by the first alternating voltage; a seventh switching element which accesses between the power line for discharging and the first reset node, and is controlled by the voltage of set node; an eighth switching element which accesses between the power line for discharging and the second reset node, and is controlled by the voltage of set node; and a ninth switching element which accesses between the set node and power line for discharging, and is controlled by at least one between the voltage of first reset node and the voltage of the second reset node. |
