ADAPTING WORD LINE PULSE WIDTHS IN MEMORY SYSTEMS

摘要

PROBLEM TO BE SOLVED: To provide systems, circuits and methods for adapting word line (WL) pulse widths for use in memory systems.SOLUTION: An embodiment comprises: a memory 210 operating according to a word line (WL) pulse with an associated WL pulse width; a built-in self-test (BIST) unit 220 that interfaces with the memory, the BIST unit being configured to run a self-test of the internal functionality of the memory and provide a signal indicating if the memory passed or failed the self-test; and an adaptive WL control circuit 240 that interfaces with the BIST unit and the memory, the adaptive WL control circuit being configured to adjust the WL pulse width of the memory on the basis of the signal provided by the BIST unit.