发明名称 MULTI-PARTICLE BEAM COLUMN HAVING AN ELECTRODE LAYER INCLUDING AN ECCENTRIC APERTURE
摘要 Disclosed herein is a multi-particle beam column including electrode layer with eccentric apertures. The multi-particle beam column includes two or more particle beam columns each comprising a particle beam emission source, a deflector, and two or more electrode layers. The multi-particle beam column includes at least one electrode layer having one or more apertures that are eccentric from respective beam optical axes of the particle beam columns.
申请公布号 US2014209813(A1) 申请公布日期 2014.07.31
申请号 US201313752040 申请日期 2013.01.28
申请人 Kim Ho Seob;Kim Dae Wook;Ahn Seung Jun;Oh Tae Sik 发明人 Kim Ho Seob;Kim Dae Wook;Ahn Seung Jun;Oh Tae Sik
分类号 G21K1/08 主分类号 G21K1/08
代理机构 代理人
主权项 1. A multi-particle beam column, comprising two or more particle beam columns, each comprising a particle beam emission source, a deflector, and two or more electrode layers, wherein the multi-particle beam column comprises at least one electrode layer having two or more apertures that are eccentric from respective beam optical axes of the particle beam columns (hereinafter referred to as the “eccentric electrode layer”), wherein the respective apertures of the eccentric electrode layer are positioned to the direction from the respective beam optical axes of the multi-particle beam column so as to avoid overlapping on the basis of the respective particle beam optical axes, wherein the eccentric electrode layer is positioned below the deflector, and wherein the respective particle beams of the multi-particle beam column are not simultaneously irradiated onto a sample.
地址 Seo-gu KR