发明名称 MULTIPLE CONCURRENT SPECTRAL ANALYSES
摘要 According to an example, apparatuses for performing multiple concurrent spectral analyses on a sample under test include an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, in which the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test. The apparatuses also include a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test. Example methods of performing spectral analysis include use of the apparatuses.
申请公布号 US2014211199(A1) 申请公布日期 2014.07.31
申请号 US201313754283 申请日期 2013.01.30
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 Kuo Huei Pei;Li Zhiyong;Wang Shih-Yuan;Barcelo Steven J.;Kim Ansoon;Gibson Gary;Bratkovski Alexandre M.
分类号 G01J3/28;G01J3/44 主分类号 G01J3/28
代理机构 代理人
主权项 1. An apparatus for performing multiple concurrent spectral analyses on a sample under test, said apparatus comprising: an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, wherein the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test; and a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test.
地址 Houston TX US