发明名称 MEASURING WALL THICKNESS LOSS FOR A STRUCTURE
摘要 Systems, methods and computer storage mediums accurately measure wall thickness in a region of interest included in complex curved structures. Embodiments of the present disclosure relate to generating a wall thickness loss distribution map of a region of interest that provides an accurate representation of wall thickness for the region of interest included in a complex curved structure. The wall thickness loss distribution map is generated from a two-dimensional model of the wall thickness loss distribution of the region of interest. The two-dimensional model is converted from a three-dimensional representation of the wall thickness loss distribution of the region of interest. The three-dimensional representation of the wall thickness is generated by ultrasonic waves generated by a transducer system that propagated through the region of interest.
申请公布号 US2014208852(A1) 申请公布日期 2014.07.31
申请号 US201414168374 申请日期 2014.01.30
申请人 CINCINNATI NDE, LTD. ;UNIVERSITY OF CINCINNATI 发明人 Instanes Geir;Nagy Peter B.;Simonetti Francesco;Willey Carson L.
分类号 G01B17/02 主分类号 G01B17/02
代理机构 代理人
主权项 1. A system for measuring wall thickness in a region of interest included in a structure, comprising: a transducer system configured to transmit a plurality of ultrasonic waves through the region of interest and convert the ultrasonic waves to propagated electrical signals that encode a three-dimensional representation of a wall thickness loss distribution of the region of interest; a pre-processing system configured to convert the three-dimensional representation encoded by the propagated electrical signals to a two-dimensional model for analysis of the wall thickness loss distribution; and an inversion system configured to generate a wall thickness loss distribution map from the two-dimensional model, wherein the wall thickness loss distribution map provides the wall thickness loss distribution for the region of interest.
地址 Cincinnati OH US
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