THIN FILM TRANSISTOR SUBSTRATE, METHOD OF INSPECTING THE SAME AND LIQUID CRYSTAL DISPLAY INCLUDING THE SAME

摘要

According to the present invention, a thin film transistor substrate includes: a display area in which a plurality of pixels, connected to gate lines and data lines which are crossed by each other, are arranged; a plurality of gate pad parts connected to one side of the gate lines; first test transistors connected to the other side of the corresponding gate lines; a plurality of data pad parts connected on one side of the data lines; second test transistors connected to the other side of the corresponding data lines; and a non-display area which is formed around the display areal. On the non-display area, the gate pad parts, the data pad parts, and the first and the second test transistors are arranged. The first test transistors are switched to receive first test signals. The second test transistors are switched to receive second test signals.